Test Technology Standards Committee

Learn more about the Test Technology Standards Committee, it's mission, chair, and more.
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The IEEE Test Technology Standards Committee (TTSC) is chartered by the IEEE Computer Society Standards Activities Board to promote the development of Standards in the Test industry [Reference: IEEE-SA Standards Board Bylaws, Subclause 4.3.1]. Such standards are beneficial to the IC designers, ATE tool and equipment vendors, and developers and users of automation tools in this industry since they provide a mechanism for defining common semantics.

The TTSC acts as the administrator for the Working Groups under it which develop and maintain Standards.

Testing of assembled printed circuit boards and other products based on highly complex digital integrated circuits and high-density, surface-mounting assembly techniques has become extremely difficult due to test access limitations. IEEE 1149.1 is particularly important to industry as many other standards including IEEE 1500, IEEE 1532, IEEE 1687, and IEEE 1838, rely on this standard and its defined Test Access Port (TAP) to provide access to and control of features built into integrated circuits.

Published standards:

  • IEEE 1500-2022, Standard Testability Method for Embedded Core-based Integrated Circuits
  • IEEE 1838-2019, Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits

Published standards under revision:

  • IEEE 1149.1-2013, Standard for Test Access Port and Boundary-Scan Architecture
  • IEEE Std 1687-2014, Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

New projects in development:

  • P1687.1, Standard for the Application of Interfaces and Controllers to Access 1687 IJTAG Networks Embedded Within Semiconductor Devices
  • P2427, Standard for Analog Defect Modeling and Coverage
  • P2929, Standard for System-level State Extraction for Functional Validation and Debug

These standards are beneficial to, and should be of interest to:

  • IP (Intellectual Property component), IC (Integrated Circuit), board, and system designers;
  • ATE (Automated Test Equipment) tool and equipment vendors;
  • and developers and users of automation tools.


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