Patrick J. Flynn is the Duda Family Professor of Engineering, Professor of Computer Science & Engineering, and Concurrent Professor of Electrical Engineering at the University of Notre Dame. He received the B.S. in Electrical Engineering (1985), the M.S. in Computer Science (1986), and the Ph.D. in Computer Science (1990) from Michigan State University, East Lansing. He has held faculty positions at Notre Dame (1990–1991, 2001–present), Washington State University (1991–1998), and The Ohio State University (1998–2001).
In 2007–2008, he held a visiting scientist appointment at the National Institute of Standards and Technology during a sabbatical leave. His research interests include computer vision, biometrics, and image processing, and he has advised or co-advised eighteen Ph.D. dissertations, six postdoctoral scholarships, twenty-two M.S. theses, and two B.S. theses. Dr. Flynn is an IEEE Fellow, an IAPR Fellow, and an ACM Distinguished Scientist. He is the Editor-in-Chief of the IEEE Biometrics Compendium, and is a past Associate Editor-in-Chief of IEEE Transactions on PAMI, and a past Associate Editor of IEEE TIFS, IEEE TIP, IEEE TPAMI, Pattern Recognition, and Pattern Recognition Letters. He has received outstanding teaching awards from Washington State University and the University of Notre Dame, and Meritorious Service, Golden Core, and Certificate of Appreciation awards from the IEEE Computer Society.
Patrick J. Flynn is the Duda Family Professor of Engineering, Professor of Computer Science & Engineering, and Concurrent Professor of Electrical Engineering at the University of Notre Dame. He received the B.S. in Electrical Engineering (1985), the M.S. in Computer Science (1986), and the Ph.D. in Computer Science (1990) from Michigan State University, East Lansing. He has held faculty positions at Notre Dame (1990–1991, 2001–present), Washington State University (1991–1998), and The Ohio State University (1998–2001).
In 2007–2008, he held a visiting scientist appointment at the National Institute of Standards and Technology during a sabbatical leave. His research interests include computer vision, biometrics, and image processing, and he has advised or co-advised eighteen Ph.D. dissertations, six postdoctoral scholarships, twenty-two M.S. theses, and two B.S. theses. Dr. Flynn is an IEEE Fellow, an IAPR Fellow, and an ACM Distinguished Scientist. He is the Editor-in-Chief of the IEEE Biometrics Compendium, and is a past Associate Editor-in-Chief of IEEE Transactions on PAMI, and a past Associate Editor of IEEE TIFS, IEEE TIP, IEEE TPAMI, Pattern Recognition, and Pattern Recognition Letters. He has received outstanding teaching awards from Washington State University and the University of Notre Dame, and Meritorious Service, Golden Core, and Certificate of Appreciation awards from the IEEE Computer Society.
