Call for Papers: IEEE International Test Conference (ITC)

Papers Submittals

Authors are invited to submit original, unpublished papers describing recent work in the field of testing and testable design. Of particular interest are works dedicated to the topics listed on the right and/or works focused on special tracks such as Automotive Reliability, Reliability of AI HW and usage of AI for Testing, 3D/2.5D and Chiplet Testing, or HW Security. Authors are also invited to submit practical, industry-oriented papers. A special industrial case-study track is dedicated to papers that enable others to learn best industrial practices.

Submissions must include:

• Title of paper.

• Name, affiliation, e-mail address of each author. (Double blind review is not required).

• The corresponding author(s). ITC will communicate with the corresponding author(s).

• One or two topic(s) from the topic list, or a description of your topic.

• An electronic copy of a complete paper of 6~10 pages for regular papers (including regular Industrial case-study papers) or 3~5 pages for short Industrial Practices papers.

• An abstract of 35 words or less to be entered online.

ITC maintains a competitive selection process for technical papers. Submissions must clearly describe the status of the reported work, its contribution, novelty and/or significance. Supporting data, results (priority is often given to papers with results from real designs) and conclusions, and references to prior work must also be included.

Authors are also invited to submit a single-page poster proposal. Posters are a useful way of presenting late-breaking results, getting feedback on an innovative method, or participating without having to write a full paper. Acceptance as a poster does not preclude submission of a more complete work as an ITC paper in 2026.

Test Week tutorial and workshop proposals are also welcomed. Deadlines and other information about proposals can be obtained from TTTC at: http://tab.computer.org/tttc

For detailed information about the submission process, requirements and deadlines, the selection process, and any other questions regarding the program itself or contact information, please consult the ITC web site at http://www.itctestweek.org.

Topics of interest include, but are not limited to:

• 3D/2.5D Test
• 5G/6G Test
• Adaptive Test in Practice
• AI/Machine Learning in Test
• ATE/Probe Card Design
• Automotive Reliability
• Advances in Boundary Scan
• Built-In Self-Test
• Data Driven Test Methods
• Defect-oriented Testing
• Design for Test (DFT)
• DFM and Test
• Diagnosis
• Economics of Test
• End-to-End Data Analysis
• End-to-End System Security
• Emerging Defect Mechanisms
• Field Monitoring, Test, & Debug
• Hardware Security and Trust
• IoT Testing
• Jitter, High-Speed I/O and RF Test
• Known-Good-Die Test
• Memory Test and Repair
• MEMS Testing
• Mixed-Signal and Analog Test
• New Technologies and Test
• Online Test
• Pre-Silicon/Post-Silicon Verification
• Power Issues in Test
• Protocol-aware Test
• Quantum Device Testing
• Reliability and Resilience
• SoC/SiP/NoC Test
• Silent Data Corruption
• Silicon Debug
• Simulation and Emulation
• System Test (Applications)
• System Test (Hardware/Software)
• Test Compression
• Test-to-Design Feedback
• Test Escape Analysis
• Test Flow Optimizations
• Test Generation and Validation
• Test Resource Partitioning
• Test Standards
• Testing High Speed Optics/Photonics
• Timing Test
• Yield Analysis and Optimization