Call For Papers: 31st IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2025)
Important Deadlines:
Abstract submission: February 23, 2025
Paper submission: March 2, 2025
Notification: April 18, 2025
Camera-ready and registration: May 25, 2025
Symposium dates: July 7-9, 2025
The IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) is an established forum for presenting novel ideas and experimental data on Online Testing techniques and, more generally, to Design for Robustness, Design for Reliability, and Design for Security. The 2025 edition of IOLTS will be an in-person event from 7 to 9 July at Continental Ischia Hotel & SPA in Ischia, Italy. You are kindly invited to participate and submit your contributions to IOLTS’25.Learn MoreView FlyerPaper Submittals
The IOLTS Program Committee invites original, unpublished, and not currently under review submissions for IOLTS 2025.
Submitted papers must be complete manuscripts, up to six pages (the references do not count towards the page limit, andreferences don’t have page limits) in a standard IEEE A4 two-column format. Papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status.
If a paper is accepted as a full paper (6 pages) or a poster (2 pages), authors will be invited to prepare a camera-ready paper for inclusion in the formal proceedings of the conference and will be required to present the paper at the conference.
For every presentation at the conference (including full oral presentations, poster presentations, and special session presentations), an associated ‘author’ registration (full registration rate) is required.
The areas of interest include (but are not limited to) the following topics:
Dependable system design
Dependable Computer Architectures
Design-for-Reliability
Design for Reliability approaches for Low-Power
Cross-layer reliability approaches
Fault-Tolerant and Fail-Safe systems
Functional safety
Self-Test and Self-Repair
Self-Healing design
Self-Regulating design
Self-Adapting design
Reliability issues of Low-Power Design
Robustness evaluation
Quality, yield, reliability, and lifespan issues in nanometer technologies
Variability, Aging, EMI, and Radiation Effects in nanometer technologies
On-line testing techniques for digital, analog, and mixed-signal circuits
Self-checking circuits and coding theory
On-line monitoring of current, temperature, process variations, and aging
Power density and overheating issues in nanometer technologies
Field Diagnosis, Maintainability, and Reconfiguration
Design for Security
Fault-based attacks and countermeasures
Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular, and satellite communications
