Test Technology Technical Community (TTTC)
TTTC treats all aspects of test technology as they pertain to test implementation, test design, manufacturing test, and standardization.
What Are the Benefits of Joining TTTC?
The IEEE Technical Community on Test Technology (TTTC) brings together professionals advancing testing methods for integrated circuits, embedded systems, software, memory, and hardware security.
You can grow your expertise and network through conferences like the IEEE VLSI Test Symposium, IEEE International Test Conference, and IEEE European Test Symposium. TTTC also offers award programs, technical working groups, and a newsletter to help members stay current and connected.
Membership is free and open to all. Join now to stay at the forefront of testing innovation and contribute to building reliable systems.
Join the Test Technology Technical Community (TTTC) to engage with experts in test implementation, design, and standardization across semiconductors, software, magnetic, and optical devices.
EMAIL TTTC CHAIRExecutive Committee
- Chair: Peilin Song
- Vice Chair: Stefano Di Carlo
TTTC-Sponsored Conferences
- IEEE Automated Testing and Quality Assurance Conference (AQTR)
- IEEE Asian Symposium on Quality Electronic Design (AsianHOST)
- IEEE Advanced Test Symposium (ATS)
- IEEE Design, Automation, and Test in Europe Conference (DATE)
- IEEE Design and Diagnostics of Electronic Circuits and Systems Conference (DDECS)
- IEEE Design for Test Conference (DFT)
- IEEE European Test Symposium (ETS)
- IEEE Eastern European Workshop on the Reliability of Digital Systems (EWDTS)
- IEEE High-Level Design Validation and Test Workshop (HLDVT)
- IEEE International Symposium on Hardware-Oriented Security and Trust (HOST)
- IEEE International On-Line Testing Symposium (IOLTS)
- IEEE International Test Conference – Asia (ITC-Asia)
- IEEE Self-Testing and Testable Systems Workshop (SELSE)