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Issue No.02 - Feb. (vol.36)
ISSN: 0162-8828
TABLE OF CONTENTS
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Naejin Kong , Max-Planck-Inst. fur Intelligente Syst., Tubingen, Germany
Yu-Wing Tai , Dept. of Electr. Eng., KAIST, Daejeon, South Korea
Joseph S. Shin , Dept. of Comput. Sci., KAIST, Daejeon, South Korea
pp. 209-221
Ian Endres , Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Champaign, IL, USA
Derek Hoiem , Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Champaign, IL, USA
pp. 222-234
Makoto Yamada , NTT Commun. Sci. Labs., Atsugi, Japan
Leonid Sigal , Disney Res. Pittsburgh, Pittsburgh, PA, USA
pp. 235-247
Dengyu Liu , Chester F. Carlson Center for Imaging Sci., Rochester Inst. of Technol., Rochester, NY, USA
Jinwei Gu , Chester F. Carlson Center for Imaging Sci., Rochester Inst. of Technol., Rochester, NY, USA
Yasunobu Hitomi , Sony Corp., Tokyo, Japan
Mohit Gupta , Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
Tomoo Mitsunaga , Sony Corp., Tokyo, Japan
Shree K. Nayar , Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
pp. 248-260
Ran He , Nat. Lab. of Pattern Recognition (NLPR), Inst. of Autom., Beijing, China
Wei-Shi Zheng , Sch. of Inf. Sci. & Technol., Sun Yat-sen Univ., Guangzhou, China
Tieniu Tan , Nat. Lab. of Pattern Recognition (NLPR), Inst. of Autom., Beijing, China
Zhenan Sun , Nat. Lab. of Pattern Recognition (NLPR), Inst. of Autom., Beijing, China
pp. 261-275
Sudheendra Vijayanarasimhan , Univ. of Texas at Austin, Austin, TX, USA
Prateek Jain , Machine Learning Group, Microsoft Res., Bangalore, India
Kristen Grauman , Univ. of Texas at Austin, Austin, TX, USA
pp. 276-288
Zhen Lei , Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Matti Pietikainen , Center for Machine Vision Res., Univ. of Oulu, Oulu, Finland
Stan Z. Li , Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
pp. 289-302
Yanwei Fu , Sch. of Electron. Eng. & Comput. Sci., Queen Mary Univ. of London, London, UK
Timothy M. Hospedales , Sch. of Electron. Eng. & Comput. Sci., Queen Mary Univ. of London, London, UK
Tao Xiang , Sch. of Electron. Eng. & Comput. Sci., Queen Mary Univ. of London, London, UK
Shaogang Gong , Sch. of Electron. Eng. & Comput. Sci., Queen Mary Univ. of London, London, UK
pp. 303-316
Yacov Hel-Or , Dept. of Comput. Sci., Interdiscipl. Center, Herzliya, Israel
Hagit Hel-Or , Dept. of Comput. Sci., Univ. of Haifa, Haifa, Israel
Eyal David , Dept. of Comput. Sci., Univ. of Haifa, Haifa, Israel
pp. 317-330
Jiwen Lu , Adv. Digital Sci. Center, Singapore, Singapore
Xiuzhuang Zhou , Coll. of Inf. Eng., Capital Normal Univ., Beijing, China
Yap-Pen Tan , Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Yuanyuan Shang , Coll. of Inf. Eng., Capital Normal Univ., Beijing, China
Jie Zhou , Dept. of Autom., Tsinghua Univ., Beijing, China
pp. 331-345
Ce Liu , Microsoft Res. New England, Cambridge, UK
Deqing Sun , Pfister Group, Harvard Univ., Cambridge, MA, USA
pp. 346-360
Xiaogang Wang , Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Meng Wang , Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Wei Li , Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
pp. 361-374
Jerod J. Weinman , Dept. of Comput. Sci., Grinnell Coll., Grinnell, IA, USA
Zachary Butler , Dept. of Comput. Sci., Grinnell Coll., Grinnell, IA, USA
Dugan Knoll , Dept. of Comput. Sci., Grinnell Coll., Grinnell, IA, USA
Jacqueline Feild , Dept. of Comput. Sci., Univ. of Massachusetts Amherst, Amherst, MA, USA
pp. 375-387
Jingdong Wang , Media Comput. Group, Microsoft Res. Asia, Beijing, China
Naiyan Wang , Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
You Jia , Carnegie Mellon Univ., Pittsburgh, PA, USA
Jian Li , Tsinghua Univ., Beijing, China
Gang Zeng , Peking Univ., Beijing, China
Hongbin Zha , Peking Univ., Beijing, China
Xian-Sheng Hua , Microsoft Corp., Redmond, WA, USA
pp. 388-403
Du Tran , Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Junsong Yuan , Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
David Forsyth , Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
pp. 404-416
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