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Issue No.04 - July/August (1990 vol.7)
pp: 50-55
ABSTRACT
<p>The use of context-free grammars to improve functional testing of very-large-scale integrated circuits is described. It is shown that enhanced context-free grammars are effective tools for generating test data. The discussion covers preliminary considerations, the first tests, generating systematic tests, and testing subroutines. The author's experience using context-free grammars to generate tests for VLSI circuit simulators indicates that they are remarkably effective tools that virtually anyone can use to debug virtually any program.</p>
INDEX TERMS
test data generation; context-free grammars; functional testing; very-large-scale integrated circuits; systematic tests; testing subroutines; VLSI circuit simulators; debug; context-free grammars; integrated circuit testing; VLSI
CITATION
Peter M. Maurer, "Generating Test Data with Enhanced Context-Free Grammars", IEEE Software, vol.7, no. 4, pp. 50-55, July/August 1990, doi:10.1109/52.56422
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