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Issue No.05 - September/October (vol.27)
ISSN: 0740-7475
TABLE OF CONTENTS
Call for Papers
From the EIC
Masthead
Masthead (Abstract)
pp. 5
Ring Oscillator Variation Analysis
Koh Johguchi , Hiroshima University
Akihiro Kaya , Hiroshima University
Shinya Izumi , Renesas Technology
Hans Mattausch , Hiroshima University
Tetsushi Koide , Hiroshima University
Norio Sadachika , Tsuneishi Shipbuilding
pp. 6-13
Physical Synthesis
David Papa , University of Michigan, Ann Arbor, and IBM Austin
Michael D. Moffitt , IBM Austin Research Lab
Charles J. Alpert , IBM Austin Research Lab
Igor L. Markov , University of Michigan , Ann Arbor
pp. 14-25
Task Mapping
Ewerson Luiz de Souza Carvalho , Pontifícia Universidade Católica do Rio Grande do Sul
Ney Laert Vilar Calazans , Pontifícia Universidade Católica do Rio Grande do Sul
Fernando Gehm Moraes , Pontifícia Universidade Católica do Rio Grande do Sul
pp. 26-35
Next-Generation Embedded Testing
Michele Portolan , Bell Labs Ireland
Suresh Goyal , Alcatel-Lucent Bell Labs
Bradford Van Treuren , Alcatel-Lucent Bell Labs
Chen-Huan Chiang , Alcatel-Lucent Bell Labs
Tapan J. Chakraborty , Alcatel-Lucent Bell Labs
Thomas B. Cook , Alcatel-Lucent Bell Labs
pp. 36-49
Failure Detection and Characterization
Alodeep Sanyal , Synopsys
Syed M. Alam , Everspin Technologies
Sandip Kundu , University of Massachusetts at Amherst
pp. 50-59
DAC 2010 Roundtable
pp. 60-67
Book Reviews
Grant Martin , Tensilica
pp. 68-69
CEDA Currents
CEDA Currents (Abstract)
pp. 70-71
Conference Reports
Conference Reports (Abstract)
pp. 72-73
DATC Newsletter
TTTC Newsletter
pp. 78-79
The Last Byte
The ABCs of ITC (Abstract)
Ron Press , Mentor Graphics
pp. 80
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