Issue No.05 - September-October (2007 vol.24)
Axel Jantsch , KTH Stockholm
Erik Jan Marinissen , NXP Research
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2007.162
The Workshop on Diagnostic Services in Network-on-Chips, held during DATE 2007, focused on test, debugging, and online monitoring in NoCs. The main body of the workshop was formed by two sessions with full-length paper presentations and two lively poster sessions with a total of 28 posters. EPFL's Giovanni De Micheli gave the keynote address, and the workshop also featured a panel session led by Tensilica's Grant Martin and invited talks by Virage Logic's Yervant Zorian and NXP Semiconductors' Kees Goossens. The workshop produced electronic online proceedings, including papers, slides, and posters-totaling 420 pages.
network on chip, NoC, diagnostic services, DATE 2007
Axel Jantsch, Erik Jan Marinissen, "DATE 07 workshop on diagnostic services in NoCs", IEEE Design & Test of Computers, vol.24, no. 5, pp. 510, September-October 2007, doi:10.1109/MDT.2007.162