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Issue No.04 - July/August (vol.23)
ISSN: 0740-7475
TABLE OF CONTENTS
On-Chip Testing
pp. 304-310
From the EIC
Conference Reports
On-Chip Testing
Dhruva Acharyya , University of Maryland, Baltimore
Jim Plusquellic , University of Maryland, Baltimore
Mohammad Tehranipoor , University of Maryland, Baltimore
Chintan Patel , University of Maryland, Baltimore
pp. 278-293
Nur A. Touba , University of Texas at Austin
pp. 294-303
Departments
CEDA Currents (Abstract)
pp. 322-325
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