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Issue No.03 - May/June (vol.21)
ISSN: 0740-7475
TABLE OF CONTENTS
EIC Message
Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 169
D&T: 20 Years of Service
Panel Summaries
Mustapha Slamani , IBM Microelectronics
Fidel Muradali , Agilent Technologies
Geir Eide , Teseda
Mike Li , Wavecrest
pp. 175-176, 261-262
Features
Yervant Zorian , Virage Logic
Dimitris Gizopoulos , University of Piraeus
Cary Vandenberg , HPL Technologies
Philippe Magarshack , STMicroelectronics
pp. 177-182
Alessandra Nardi , University of California, Berkeley
Alberto L. Sangiovanni-Vincentelli , University of California, Berkeley
pp. 192-199
Davide Appello , STMicroelectronics
Alessandra Fudoli , STMicroelectronics
Katia Giarda , STMicroelectronics
Vincenzo Tancorre , STMicroelectronics
Emil Gizdarski , Synopsys
Ben Mathew , Synopsys
pp. 208-215
Melvin A. Breuer , University of Southern California
Sandeep K. Gupta , University of Southern California
T.M. Mak , Intel
pp. 216-227
Subhasish Mitra , Center for Reliable Computing, Stanford University
Wei-Je Huang , Center for Reliable Computing, Stanford University
Nirmal R. Saxena , Center for Reliable Computing, Stanford University
Shu-Yi Yu , Center for Reliable Computing, Stanford University
Edward J. McCluskey , Center for Reliable Computing, Stanford University
pp. 228-240
T.M. Mak , Intel
Angela Krstic , University of California, Santa Barbara
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
Li-C. Wang , University of California, Santa Barbara
pp. 241-247
Bhaskar Chatterjee , University of Waterloo
Manoj Sachdev , University of Waterloo
Ali Keshavarzi , Intel Laboratories
pp. 248-258
DAC Watch
DAC Highlights (Abstract)
Luciano Lavagno , Cadence Berkeley Labs and Politecnico di Torino
pp. 259-260
DATC Newsletter
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