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Issue No.01 - January/February (vol.20)
ISSN: 0740-7475
EIC Message
Nico Bruels , Infineon Technologies AG
Ulrich Hachmann , Infineon Technologies AG
Jens Harnisch , Infineon Technologies AG
Ulrich Ramacher , Infineon Technologies AG
Christian Sauer , Infineon Technologies AG
Axel Techmer , Infineon Technologies AG
pp. 8-16
Peter Petrov , University of California, San Diego
Alex Orailoglu , University of California, San Diego
pp. 18-25
Jong-eun Lee , Seoul National University
Kiyoung Choi , Seoul National University
Nikil D. Dutt , University of California, Irvine
pp. 26-33
Manuel Hohenauer , Aachen University of Technology
Rainer Leupers , Aachen University of Technology
Oliver Wahlen , Aachen University of Technology
pp. 34-41
Special Features
J?erg E. Vollrath , Infineon Technologies AG
pp. 42-50
Grzegorz Mrugalski , Poznan University of Technology
Jerzy Tyszer , Poznan University of Technology
Janusz Rajski , Mentor Graphics
pp. 51-59
Yves Bertrand , LIRMM, University of Montpellier
Michel Renovell , LIRMM, University of Montpellier
Andr? Ivanov , University of British Columbia
Florence Aza? , LIRMM, University of Montpellier
pp. 60-67
Marcelo Negreiros , Universidade Federal do Rio Grande do Sul
Gabriel Parmegiani Jahn , Universidade Federal do Rio Grande do Sul
Ad?o Ant?nio de Souza Jr. , Universidade Federal do Rio Grande do Sul
Denis Teixeira Franco , Universidade Federal do Rio Grande do Sul
pp. 76-84
The Road Ahead
Error Tolerance (Abstract)
Andrew B. Kahng , University of California, San Diego
pp. 86-87
Panel Summarie
ITC 2002 Panels (Abstract)
pp. 88-90
Peter J. Ashenden , Ashenden Designs
pp. 91-92
Conference Reports
pp. 92
DATC Newsletter (Abstract)
pp. 93
TTTC Newsletter (Abstract)
pp. 94-95
The Last Byte
Frank Vahid , University of California, Riverside
pp. 96
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