Transactions on Computers Media Center
Our volunteers share with the wider community their views and experiences on a variety of topics. The volunteers can range from associate editors to authors, reviewers or members from the research community at large. The interviews are intended to cover a wide spectrum of topics that are relevant to our community. These topics can be in the form of "shared experiences" and "lessons learned" or highlighting a new technological or theoretical breakthrough. We hope that members of the community will actively participate in making this new feature a great success. For information on submitting multimedia content, please click here.
Albert Zomaya
TC EIC
A Word from the Editor-in-Chief,
Albert Y. Zomaya
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It is our new publication model that is a hybrid of online only and print, giving subscribers the best of both worlds—online access plus a printed book of article abstracts and a searchable interactive disk that allows readers to access content anywhere without an internet connection for less than a traditional print subscription.
Essential Sets: Industry's Interest in Computer Arithmetic Research: Part I, Dr. Schwarz's view
Dr. Eric Schwarz describes the important aspects of computer arithmetic research. He provides a list of current questions that need to be solved by research and also what topics are the most interesting to industry.
Purchase the Essential Sets here:
Volume 1:
www.computer.org/portal/web/store?product_id=ES0000033&category_id=TechSets
Volume 2:
www.computer.org/portal/web/store?product_id=ES0000034&category_id=TechSets
Essential Sets: Industry's Interest in Computer Arithmetic Research: Part II, Dr. Hu's view
Dr. Hu describes the important aspects of computer arithmetic research. He provides a list of current questions that need to be solved by research and also what topics are the most interesting to industry.
Purchase the Essential Sets here:Volume 1:
www.computer.org/portal/web/store?product_id=ES0000033&category_id=TechSets
Volume 2:
www.computer.org/portal/web/store?product_id=ES0000034&category_id=TechSets
Concurrent On-Line Testing and Error/Fault Resilience of Digital Systems
Guest editor Cecilia Metra discusses the "Concurrent On-Line Testing and Error/Fault Resilience of Digital Systems" theme issue for IEEE Transactions on Computers. View the issue here: