IEEE Design & Test of Computers

IEEE Design & Test of Computers covers the tools, techniques, and concepts used to design and test electronic product hardware and supportive software. D&T is a leader in analysis of current and near-future practice.  More »

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D&T combines well-written, informative articles with features such as interviews and roundtables, which give us insight into the big issues... It's the only design and test oriented publication I know of that provides direct access to new ideas and commentary on those ideas in one place.

- Scott Davidson,
Sun Microsystems

Current Issue

March/April 2010 D&T CoverMarch/April 2010

Compact variability modeling to the rescue

Chip designers today have to account for process variations in nanometer CMOS technology. Innovations in manufacturing proceses alone are no longer sufficient to mitigate the adverse effects of process variations. The need of the hour is to develop accurate, but tractable and compact, variability models that can handle spatial and temporal aspects of process variations. This issue presents readers with tutorial material, research advances, practical experiences, and perspectives on future trends. More »

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