IEEE Design & Test of Computers

IEEE Design & Test of Computers covers the tools, techniques, and concepts used to design and test electronic product hardware and supportive software. D&T is a leader in analysis of current and near-future practice.  More »

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D&T combines well-written, informative articles with features such as interviews and roundtables, which give us insight into the big issues... It's the only design and test oriented publication I know of that provides direct access to new ideas and commentary on those ideas in one place.

- Scott Davidson,
Sun Microsystems

Current Issue

Nov/Dec 2009 D&T CoverNov./Dec. 2009

Design for Reliability at 32 nm and Beyond

VLSI design is driven by an ever-increasing challenge to cope with unreliable components at the device, circuit, and system levels. This special issue addresses the problem of design for reliability at the 32-nm node and beyond, in the context of the emerging threat of progressively unreliable components used in VLSI chip design. More »

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