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Issue No.10 - Oct. (vol.35)
ISSN: 0162-8828
TABLE OF CONTENTS
Front Covers
Eryun Liu , Dept. of Comput. Sci. & Eng., Michigan State Univ. (MSU), East Lansing, MI, USA
A. K. Jain , Dept. of Comput. Sci. & Eng., Michigan State Univ., East Lansing, MI, USA
Jie Tian , Sch. of Life Sci. & Technol., Xidian Univ., Xi'an, China
pp. 2307-2322
REGULAR PAPERS
Tingting Mu , Dept. of Electr. Eng. & Electron., Univ. of Liverpool, Liverpool, UK
J. Y. Goulermas , Dept. of Electr. Eng. & Electron., Univ. of Liverpool, Liverpool, UK
pp. 2340-2356
A. Censi , Control & Dynamical Syst. Dept., California Inst. of Technol., Pasadena, CA, USA
D. Scaramuzza , Dept. of Inf., Univ. of Zurich, Zurich, Switzerland
pp. 2357-2370
G. D. Evangelidis , Perception Team, INRIA Rhone-Alpes, Grenoble, France
C. Bauckhage , Fraunhofer IAIS, St. Augustin, Germany
pp. 2371-2386
A. Penate-Sanchez , Inst. de Roboticai Inf. Ind., UPC, Barcelona, Spain
J. Andrade-Cetto , Inst. de Roboticai Inf. Ind., UPC, Barcelona, Spain
F. Moreno-Noguer , Inst. de Roboticai Inf. Ind., UPC, Barcelona, Spain
pp. 2387-2400
Xin Geng , Sch. of Comput. Sci. & Eng., Southeast Univ., Nanjing, China
Chao Yin , Sch. of Comput. Sci. & Eng., Southeast Univ., Nanjing, China
Zhi-Hua Zhou , Nat. Key Lab. for Novel Software Technol., Nanjing Univ., Nanjing, China
pp. 2401-2412
Xiang-Dong Zhou , Beijing Key Lab. of Human-Comput. Interaction, Inst. of Software, Beijing, China
Da-Han Wang , Nat. Lab. of Pattern Recognition (NLPR), Inst. of Autom., Beijing, China
Feng Tian , State Key Lab. of Comput. Sci., Inst. of Software, Beijing, China
Cheng-Lin Liu , Nat. Lab. of Pattern Recognition (NLPR), Inst. of Autom., Beijing, China
M. Nakagawa , Dept. of Comput. & Inf. Sci., Tokyo Univ. of Agric. & Technol., Koganei, Japan
pp. 2413-2426
Junseok Kwon , Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
Kyoung Mu Lee , Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
pp. 2427-2441
Gang Wang , Adv. Digital Sci. Center, Nanyang Technol. Univ., Singapore, Singapore
D. Forsyth , Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
D. Hoiem , Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
pp. 2442-2453
J. Domke , NICTA, Australia Nat. Univ., Canberra, ACT, Australia
pp. 2454-2467
Yongmian Zhang , IT Res. Div., Konica Minolta Lab. U.S.A. Inc., San Mateo, CA, USA
Yifan Zhang , Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
E. Swears , Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
N. Larios , Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Ziheng Wang , Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Qiang Ji , Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
pp. 2468-2483
Seyed Mohammad Hassan Anvar , Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Wei-Yun Yau , Inst. for Infocomm Res., A*STAR, Singapore, Singapore
Eam Khwang Teoh , Div. of Control & Instrum., Nanyang Technol. Univ., Singapore, Singapore
pp. 2484-2497
Yu-Wing Tai , Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Xiaogang Chen , Inst. of Image Process. & Pattern Recognition, Shanghai Jiaotong Univ., Shanghai, China
Sunyeong Kim , Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Seon Joo Kim , Dept. of Comput. Sci., Yonsei Univ., Seoul, South Korea
Feng Li , Mitsubishi Electr. Res. Labs., Cambridge, MA, USA
Jie Yang , Inst. of Image Process. & Pattern Recognition, Shanghai Jiaotong Univ., Shanghai, China
Jingyi Yu , Dept. of CIS, Univ. of Delaware, Newark, DE, USA
Y. Matsushita , Microsoft Res. Asia, Beijing, China
M. S. Brown , Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
pp. 2498-2512
T. Dekel Basha , Dept. of Electr. Eng., Tel-Aviv Univ., Tel-Aviv, Israel
Y. Moses , Interdiscipl. Center, Herzliya, Israel
S. Avidan , Dept. of Electr. Eng., Tel-Aviv Univ., Tel-Aviv, Israel
pp. 2513-2525
N. Jacobs , Dept. of Comput. Sci., Univ. of Kentucky, Lexington, KY, USA
A. Abrams , Dept. of Comput. Sci., Univ. of Kentucky, Lexington, KY, USA
R. Pless , Dept. of Comput. Sci., Washington Univ. in St. Louis, St. Louis, MO, USA
pp. 2526-2538
Dongbo Min , Adv. Digital Sci. Center, Singapore, Singapore
Jiangbo Lu , Adv. Digital Sci. Center, Singapore, Singapore
M. N. Do , 115 Coordinated Sci. Lab., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
pp. 2539-2545
Zhou Ren , Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Junsong Yuan , Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Wenyu Liu , Huazhong Univ. of Sci. & Technol., Wuhan, China
pp. 2546-2552
I. Leichter , Adv. Technol. Labs. Israel- Microsoft Res., Microsoft R&D Center, Haifa, Israel
E. Krupka , Adv. Technol. Labs. Israel- Microsoft Res., Microsoft R&D Center, Haifa, Israel
pp. 2553-2560
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