The Community for Technology Leaders
RSS Icon
Issue No.06 - November/December (vol.23)
ISSN: 0740-7475
From the EIC
Process Variation and Stochastic Design and Test
Mehrdad Nourani , University of Texas at Dallas
Arun Radhakrishnan , Texas Instruments
pp. 438-451
Sounil Biswas , Carnegie Mellon University
Ronald D. (Shawn) Blanton , Carnegie Mellon University
pp. 452-462
Soumendu Bhattacharya , Texas Instruments
Abhijit Chatterjee , Georgia Institute of Technology
pp. 464-475
Dennis Sylvester , University of Michigan, Ann Arbor
David Blaauw , University of Michigan, Ann Arbor
Eric Karl , University of Michigan, Ann Arbor
pp. 484-490
pp. 492-499
Vladimir Hahanov , Kharkov National University of Radioelectronics
pp. 504-505
CEDA Currents (Abstract)
pp. 506
IEEE Design & Test of Computers 2006 Annual Index, Volume 23
The Last Byte
64 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool