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Issue No.04 - July/August (vol.21)
ISSN: 0740-7475
TABLE OF CONTENTS
EIC Message
Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 269-270
Features
Sumit DasGupta , Silicon Integration Initiative
pp. 271-273
Andr? Ivanov , University of British Columbia
Fabrizio Lombardi , Northeastern University
Cecilia Metra , University of Bologna
pp. 274-276
David C. Keezer , Georgia Institute of Technology
Dany Minier , IBM Canada
pp. 288-301
Nelson Ou , University of British Columbia
Touraj Farahmand , University of British Columbia
Andy Kuo , University of British Columbia
Sassan Tabatabaei , University of British Columbia
Andr? Ivanov , University of British Columbia
pp. 302-313
Special Features
Ming-Jun Hsiao , National Tsing Hua University
Jing-Reng Huang , National Tsing Hua University
Tsin-Yuan Chang , National Tsing Hua University
pp. 322-330
Departments
Conference Reports (Abstract)
pp. 339-341
Panel Summaries (Abstract)
Ajay Khoche , Agilent Technologies
pp. 342
Rob Aitken , Artisan Components
pp. 344
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