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Issue No.01 - January/February (vol.21)
ISSN: 0740-7475
TABLE OF CONTENTS
EIC Message
Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 1
Features
David Kung , IBM T.J. Watson Research Center
Ruchir Puri , IBM T.J. Watson Research Center
Louise Trevillyan , IBM T.J. Watson Research Center
Michael A. Kazda , IBM Microelectronics Division
pp. 14-22
Jinan Lou , Synopsys
Wei Chen , Synopsys
pp. 24-32
Nontheme Features
Cheng-Wen Wu , National Tsing Hua University
Bin-Hong Lin , Intellectual Property Library Co.
pp. 34-43
Ismet Bayraktaroglu , Sun Microsystems
Alex Orailoglu , University of California, San Diego
pp. 44-55
Departments
Hans-Joachim Wunderlich , University of Stuttgart
pp. 65-66
Conference Reports (Abstract)
Xiaowei Li , Institute of Computing Technology, Chinese Academy of Sciences
pp. 68
pp. 70-71
The Last Byte
Scott Davidson , Sun Microsystems
pp. 72
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