1998 Harry H. Goode Memorial Award Recipient
“For innovative contributions to the field of electronic testing”
Vishwani D. Agrawal received the B.Sc. degree from the University of Allahabad, India, the B.E. degree from the University of Roorkee, India, the M.E. degree from the Indian Institute of Science, and the Ph.D. degree from the University of Illinois at Urbana-Champaign. He has worked in various capacities in both industry and academe. He is currently a Distinguished Member of Technical Staff at AT&T Bell Labs., Murray Hill, NJ., and a Visiting Professor at the Electrical and Computer Engineering Department, Rutgers University.
Dr. Agrawal was formerly the Editor-in-Chief of IEEE Design & Test of Computers, and is currently the Editor-in-Chief of the Journal of Electronic Testing - Theory and Applications. He has published over one hundred papers and has won several Best Paper Awards. He is the co-author of the books Test Generation for VLSI Chips, Unified Methods for VLSI Simulation and Test Generation, and Neural Models and Algorithms for Digital Testing.
Dr. Agrawal's current research interests are:
* Synthesis for Testability.
* Neural Net Methods for Test Generation.
* Parallel Algorithms for Fault Simulation.
* Statistical Methods for Test Generation.
Dr. Agrawal is a Fellow of the IEEE and a member of the ACM.