The Community for Technology Leaders
Green Image
Issue No. 06 - November/December (2011 vol. 37)
ISSN: 0098-5589
pp: 872-877
Alessandro Murgia , University of Cagliari, Cagliari
Ivana Turnu , University of Cagliari, Cagliari
Michele Marchesi , University of Cagliari, Cagliari
Roberto Tonelli , University of Cagliari, Cagliari
Giulio Concas , University of Cagliari, Cagliari
ABSTRACT
The distribution of bugs in software systems has been shown to satisfy the Pareto principle, and typically shows a power-law tail when analyzed as a rank-frequency plot. In a recent paper, Zhang showed that the Weibull cumulative distribution is a very good fit for the Alberg diagram of bugs built with experimental data. In this paper, we further discuss the subject from a statistical perspective, using as case studies five versions of Eclipse, to show how log-normal, Double-Pareto, and Yule-Simon distributions may fit the bug distribution at least as well as the Weibull distribution. In particular, we show how some of these alternative distributions provide both a superior fit to empirical data and a theoretical motivation to be used for modeling the bug generation process. While our results have been obtained on Eclipse, we believe that these models, in particular the Yule-Simon one, can generalize to other software systems.
INDEX TERMS
Software bug distribution, empirical research, object-oriented systems.
CITATION
Alessandro Murgia, Ivana Turnu, Michele Marchesi, Roberto Tonelli, Giulio Concas, "On the Distribution of Bugs in the Eclipse System", IEEE Transactions on Software Engineering, vol. 37, no. , pp. 872-877, November/December 2011, doi:10.1109/TSE.2011.54
83 ms
(Ver 3.1 (10032016))