Issue No. 07 - July (1997 vol. 23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/32.605761
<p><b>Abstract</b>—This paper describes a new approach to testing that uses combinatorial designs to generate tests that cover the pair-wise, triple, or n-way combinations of a system's test parameters. These are the parameters that determine the system's test scenarios. Examples are system configuration parameters, user inputs and other external events. We implemented this new method in the AETG system. The AETG system uses new combinatorial algorithms to generate test sets that cover all valid n-way parameter combinations. The size of an AETG test set grows logarithmically in the number of test parameters. This allows testers to define test models with dozens of parameters. The AETG system is used in a variety of applications for unit, system, and interoperability testing. It has generated both high-level test plans and detailed test cases. In several applications, it greatly reduced the cost of test plan development.</p>
Testing, combinatorial designs, experimental designs, orthogonal arrays.
M. L. Fredman, G. C. Patton, S. R. Dalal and D. M. Cohen, "The AETG System: An Approach to Testing Based on Combinatorial Design," in IEEE Transactions on Software Engineering, vol. 23, no. , pp. 437-444, 1997.