Issue No. 02 - February (1994 vol. 20)

ISSN: 0098-5589

pp: 149-162

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/32.265636

ABSTRACT

<p>Presents a method of generating test sequences for concurrent programs and communication protocols that are modeled as communicating nondeterministic finite-state machines (CNFSMs). A conformance relation, called trace-equivalence, is defined within this model, serving as a guide to test generation. A test generation method for a single nondeterministic finite-state machine (NFSM) is developed, which is an improved and generalized version of the Wp-method that generates test sequences only for deterministic finite-state machines. It is applicable to both nondeterministic and deterministic finite-state machines. When applied to deterministic finite-state machines, it yields usually smaller test suites with full fault coverage than the existing methods that also provide full fault coverage, provided that the number of states in implementation NFSMs are bounded by a known integer. For a system of CNFSMs, the test sequences are generated in the following manner: a system of CNFSMs is first reduced into a single NFSM by reachability analysis; then the test sequences are generated from the resulting NFSM using the generalized Wp-method.</p>

INDEX TERMS

program testing; multiprocessing programs; protocols; finite state machines; conformance testing; specification languages; software engineering; programming theory; test selection; communicating nondeterministic finite-state machines; generalized Wp-method; test sequence generation; concurrent programs; communication protocols; conformance relation; trace-equivalence; deterministic finite-state machines; test suites; fault coverage; reachability analysis; protocol conformance testing; protocol engineering; SDL; software engineering; software testing

CITATION

A. Petrenko, Gang Luo, G. von Bochmann, "Test Selection Based on Communicating Nondeterministic Finite-State Machines Using a Generalized Wp-Method",

*IEEE Transactions on Software Engineering*, vol. 20, no. , pp. 149-162, February 1994, doi:10.1109/32.265636