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Issue No.05 - September/October (2011 vol.8)
pp: 640-655
K. Pattabiraman , Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
G. P. Saggese , Synopsys Inc., Mountain View, CA, USA
D. Chen , Coordinated Sci. Lab., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Z. Kalbarczyk , Coordinated Sci. Lab., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
R. Iyer , Coordinated Sci. Lab., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
This paper proposes a novel technique for preventing a wide range of data errors from corrupting the execution of applications. The proposed technique enables automated derivation of fine-grained, application-specific error detectors based on dynamic traces of application execution. The technique derives a set of error detectors using rule-based templates to maximize the error detection coverage for the application. A probability model is developed to guide the choice of the templates and their parameters for error-detection. The paper also presents an automatic framework for synthesizing the set of detectors in hardware to enable low-overhead, runtime checking of the application. The coverage of the derived detectors is evaluated using fault-injection experiments, while the performance and area overheads of the detectors are evaluated by synthesizing them on reconfigurable hardware.
system monitoring, field programmable gate arrays, probability, reconfigurable hardware, application-specific error detectors, dynamic analysis, data errors, application execution, rule-based templates, probability model, fault-injection experiments, Detectors, Runtime, Fault detection, Computer crashes, Hardware, Error correction codes, Programming profession, Field programmable gate arrays, Protection, Registers, FPGA hardware., Data errors, dynamic execution, likely invariants, critical variables
K. Pattabiraman, G. P. Saggese, D. Chen, Z. Kalbarczyk, R. Iyer, "Automated Derivation of Application-Specific Error Detectors Using Dynamic Analysis", IEEE Transactions on Dependable and Secure Computing, vol.8, no. 5, pp. 640-655, September/October 2011, doi:10.1109/TDSC.2010.19
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