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Built-In Self-Test (BIST) techniques constitute an attractive and practical solution to the difficult problem of testing VLSI circuits and systems. Input vector monitoring concurrent BIST schemes can circumvent problems appearing separately in online and in offline BIST schemes. An important measure of the quality of an input vector monitoring concurrent BIST scheme is the time required to complete the concurrent test, termed Concurrent Test Latency. In this paper, a new input vector monitoring concurrent BIST technique for combinational circuits is presented which is shown to be significantly more efficient than the input vector monitoring techniques proposed to date with respect to Concurrent Test Latency and hardware overhead trade-off, for low values of the hardware overhead.
Index Terms- Built-in self test, concurrent testing, input vector monitoring concurrent BIST.

I. Voyiatzis and C. Halatsis, "A Low-Cost Concurrent BIST Scheme for Increased Dependability," in IEEE Transactions on Dependable and Secure Computing, vol. 2, no. , pp. 150-156, 2005.
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