Issue No. 02 - February (2005 vol. 27)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TPAMI.2005.32
We are delighted to announce the appointment of Dr. Dorin Comaniciu and Dr. Anuj Srivastava as new associate editors of the IEEE Transactions on Pattern Analysis and Machine Intelligence. Dr. Comaniciu will assist with handling papers in the areas of tracking, information fusion, robust methods, statistical methods, nonparametric analysis, scale selection, and medical imaging. Professor Srivastava will help with submissions in statistical modeling of images, object recognition algorithms and performance evaluation, differential geometric approaches in vision, Monte Carlo-based algorithms, and statistical shape analysis. Their brief biographies appear below.
We would also like to thank outgoing associate editors,Drs. Matti Pietikainen, P. Anandan, and Alan Yuille. Theyserved under former Editor-in-Chief Rama Chellappa, and their dedication and service to TPAMI is greatly appreciated.
David J. Kriegman, Editor-in-Chief
David Fleet, Associate-Editor-in-Chief
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Dorin Comaniciu received PhD degrees in electrical engineering from the Polytechnic University of Bucharest in 1995 and from Rutgers University in 1999. Since 1999, he has been with Siemens Corporate Research in Princeton New Jersey, first as a member of technical staff, then as a senior member of technical staff and manager of the Statistical Methods for Vision Systems Program. He is currently the head of the Integrated Data Systems Department. His research interests include robust methods for computer vision, motion estimation, nonparametric analysis, robust information fusion, medical imaging, personalized medicine, content-based access to visual data, and integrated information modeling. He holds two US patents and has coauthored more than 80 papers, conference papers, and book chapters in the area of visual information processing. For his work in object tracking, he has received the Best Paper Award at the 2000 IEEE Conference on Computer Vision and Pattern Recognition. For his innovations in the areas of medical imaging and intelligent vehicles, he has received the 2004 Siemens Inventor of the Year Award, the highest technical recognition of Siemens AG worldwide. From 2002 to 2004, he served as an associate editor of Pattern Analysis and Applications journal. He is a senior member of the IEEE.
Anuj Srivastava received the BTech degree in electronics engineering from the Institute of Technology, Banaras Hindu University, India, in 1990, and the MS and PhD degrees in electrical engineering from Washington University, St. Louis, Missouri, in the 1993 and 1996, respectively. He was a visiting research associate at the Division of Applied Mathematics, Brown University, from 1996 to 1997, and then joined the Department of Statistics at Florida State University (FSU) in Tallahassee, as an assistant professor in 1997. Currently, he is an associate professor there. He is also a member of the Center for Applied Vision and Imaging Sciences (CAVIS) at FSU. He has been a member of several conference technical committees, including IEEE SSP Workshop (2003), ICPR (2004), CVPR (2004), and Biometrics Symposium (2004). He is also an associate editor of IEEE Signal Processing and the Journal of Statistical Planning and Inference. His research is primarily focused on use of statistics and differential geometry for applications in computer vision, image analysis, and signal processing.