Issue No. 11 - November (1997 vol. 19)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/34.632986
<p><b>Abstract</b>—We propose and analyze a method for improving the performance of subpixel Edge Localization (EL) techniques through compensation of the systematic portion of the localization error. The method is based on the estimation of the EL characteristic through statistical analysis of a test image and is independent of the EL technique in use.</p>
Feature extraction, edge localization, subpixel detection.
A. Sarti, S. Tubaro and F. Pedersini, "Estimation and Compensation of Subpixel Edge Localization Error," in IEEE Transactions on Pattern Analysis & Machine Intelligence, vol. 19, no. , pp. 1278-1284, 1997.