Issue No. 06 - June (1995 vol. 17)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/34.387511
<p><it>Abstract</it>—This paper concerns the problem of obtaining subpixel estimates of the locations of straight edges in binary digital images using dithering. By adding uniformly distributed independent random noise it is shown that estimation bias may be removed and that the estimation variance is inversely proportional to the length of the line segment. The sensitivity to incorrect dither amplitude is calculated, and implementation is discussed.</p>
Dither, edge, inspection, subpixel.
X. Liu and R. W. Ehrich, "Subpixel Edge Location in Binary Images Using Dithering," in IEEE Transactions on Pattern Analysis & Machine Intelligence, vol. 17, no. , pp. 629-634, 1995.