Issue No. 04 - April (1994 vol. 16)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/34.277593
<p>In this paper we describe a new technique for ID and 2D edge feature extraction to subpixel accuracy using edge models and the local energy approach. A candidate edge is modeled as one of a number of parametric edge models, and the fit is refined by a least-squared error fitting technique.</p>
edge detection; feature extraction; computer vision; computer vision; subpixel accuracy; local energy; 2D edge; ID and 2D edge; feature extraction; parametric edge models; least squared error fitting
S. Venkatesh, G. West and M. Kisworo, "Modeling Edges at Subpixel Accuracy Using the Local Energy Approach," in IEEE Transactions on Pattern Analysis & Machine Intelligence, vol. 16, no. , pp. 405-410, 1994.