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<p>In this paper, the method of elliptic Fourier descriptors using arc length parameterization is applied to tackle the problem of detection and recovery of symmetry under parallel projection. A simple and fast iteration algorithm together with the invariants of symmetry provides sufficient information for the detection and recovery of symmetry under parallel projection. The proposed method has been extensively tested using symmetric figures under different parallel projections. Simulation results of the algorithm are presented. The extension of this method for planar object recognition under parallel projection is also addressed.</p>
invariance; iterative methods; computer vision; series (mathematics); elliptic Fourier descriptors; symmetry detection; parallel projection; arc length parameterization; iteration algorithm; invariants; planar object recognition

R. Yip, P. Tam and D. Leung, "Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection," in IEEE Transactions on Pattern Analysis & Machine Intelligence, vol. 16, no. , pp. 277-286, 1994.
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