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Green Image
Issue No. 04 - July (1988 vol. 10)
ISSN: 0162-8828
pp: 496-513
ABSTRACT
<p>Various types of moments have been used to recognize image patterns in a number of applications. A number of moments are evaluated and some fundamental questions are addressed, such as image-representation ability, noise sensitivity, and information redundancy. Moments considered include regular moments, Legendre moments, Zernike moments, pseudo-Zernike moments, rotational moments, and complex moments. Properties of these moments are examined in detail and the interrelationships among them are discussed. Both theoretical and experimental results are presented.</p>
INDEX TERMS
picture processing; pattern recognition; image analysis; image-representation; noise sensitivity; information redundancy; regular moments; Legendre moments; Zernike moments; rotational moments; complex moments; pattern recognition; picture processing
CITATION

C. Teh and R. Chin, "On Image Analysis by the Methods of Moments," in IEEE Transactions on Pattern Analysis & Machine Intelligence, vol. 10, no. , pp. 496-513, 1988.
doi:10.1109/34.3913
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