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Issue No. 02 - February (1986 vol. 8)
ISSN: 0162-8828
pp: 276-282
Leo Dorst , Department of Applied Physics, Delft University of Technology, 2628 CJ Delft, The Netherlands.
Arnold W. M. Smeulders , Department of Pathology and Medical Informatics, Free University, Amsterdam, The Netherlands.
This paper considers the problem of measuring properties of digitized straight lines from the viewpoint of measurement methodology. The measurement and estimation process is described in detail, revealing the importance of a step called ``characterization'' which was not recognized explicitly before. Using this new concept, BLUE (Best Linear Unbiased) estimators are found. These are calculated for various properties of digitized straight lines, and are briefly compared to previous work.

L. Dorst and A. W. Smeulders, "Best Linear Unbiased Estimators for Properties of Digitized Straight Lines," in IEEE Transactions on Pattern Analysis & Machine Intelligence, vol. 8, no. , pp. 276-282, 1986.
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