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Issue No. 01 - January (1984 vol. 6)
ISSN: 0162-8828
pp: 115-118
K. Fukunaga , Department of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
J. M. Mantock , Department of Electrical Engineering, Purdue University, West Lafayette, IN; Aerospace Corporation, Los Angeles, CA; Texas Instruments, Inc., Dallas, TX.
ABSTRACT
A nonparametric data reduction technique is proposed. Its goal is to select samples that are ``representative'' of the entire data set. The technique is iterative and is based on the use of a criterion function and nearest neighbor density estimates. Experiments are presented to demonstrate the algorithm.
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CITATION
K. Fukunaga, J. M. Mantock, "Nonparametric Data Reduction", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol. 6, no. , pp. 115-118, January 1984, doi:10.1109/TPAMI.1984.4767485
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