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TABLE OF CONTENTS
Issue No. 06 - June (vol. 5)
ISSN: 0162-8828
Papers

[Front cover] (PDF)

pp. c1

Breaker Page (PDF)

pp. nil1

Introduction to the Special Section (PDF)

Joseph L. Mundy , Guest Editor, Adjunct Professor in the Department of Mathematical Science at RPI.
John F. Jarvis , Guest Editor, Head of the Robotics Systems Research Department of AT&T Bell Laboratories, Holmdel, NJ.
pp. 561-562

A Real-Time Automated Visual Inspection System for Hot Steel Slabs (Abstract)

Tod S. Levitt , MEMBER, IEEE, Honeywell Systems and Research Center, 2600 Ridgway Parkway, Minneapolis, MN 55413.
Bindinganavle R. Suresh , MEMBER, IEEE, Honeywell Systems and Research Center, 2600 Ridgway Parkway, Minneapolis, MN 55413.
Richard A. Fundakowski , Honeywell Systems and Research Center, 2600 Ridgway Parkway, Minneapolis, MN 55413.
John E. Overland , Honeywell Systems and Research Center, 2600 Ridgway Parkway, Minneapolis, MN 55413.
pp. 563-572

Identifying and Locating Surface Defects in Wood: Part of an Automated Lumber Processing System (Abstract)

Richard W. Conners , MEMBER, IEEE, Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA 70803.
Ramon E. Vasquez-Espinosa , STUDENT MEMBER, IEEE, Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA 70803.
Charles W. Mcmillin , Southern Forest Experiment Station, USDA Forest Service, 2500 Shreveport Highway, Pineville, LA 71360.
Kingyao Lin , MEMBER, IEEE, Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA 70803; Bell Laboratories, Murray Hill, NJ 07974.
pp. 573-583

INSPECTOR: A Computer Vision System that Learns to Inspect Parts (Abstract)

W. A. Perkins , Computer Science Department, General Motors Research Laboratories, Warren, MI 49090; Lockheed Palo Alto Research Laboratory, Palo Alto, CA 94304.
pp. 584-592

Precision of Digital Vision Systems (Abstract)

Chih-Shing Ho , Unimation, Inc., Shelter Rock Lane, Danbury, CT 06810; APPLICON, 32 Second Avenue, Burlington, MA 01803.
pp. 593-601

Integrated Testing and Algorithms for Visual Inspection of Integrated Circuits (Abstract)

L. F. Pau , SENIOR MEMBER, IEEE, Centres de Recherche de Geneve, Battelle Memorial Institute, 1227 Carouge, Geneva, Switzerland.
pp. 602-608

Efficient 3-D Object Representations for Industrial Vision Systems (Abstract)

Thomas C. Henderson , Department of Computer Science, University of Utah, Salt Lake City, UT 84112.
pp. 609-618

GAGESIGHT: A Computer Vision System for Automatic Inspection of Instrument Gauges (Abstract)

Michael L. Baird , Motors Research Laboratories, Warren, MI 48090; Artificial Intelligence Laboratory, Advanced Research and Development, Fairchild Camera and Instrument Corporation, 4001 Miranda Ave
pp. 618-621

Gauge Inspection Using Hough Transforms (Abstract)

Charles R. Dyer , Department of Computer Sciences, University of Wisconsin, Madison, WI 53706.
pp. 621-623

Automatic Inspection System for Printed Circuit Boards (Abstract)

Yasuhiko Hara , Production Engineering Research Laboratory, Hitachi, Ltd., 292 Yoshida-cho, Totsuka-ku, Yokohama 244, Japan.
Nobuyuki Akiyama , Production Engineering Research Laboratory, Hitachi, Ltd., 292 Yoshida-cho, Totsuka-ku, Yokohama 244, Japan.
Koichi Karasaki , Kanagawa Works, Hitachi, Ltd., 1 Horiyamashita, Hatano-shi, Kanagawa 259-13, Japan.
pp. 623-630

Error Analysis of Surface Normals Determined by Radiometry (Abstract)

Robert B. Kelley , Robotics Research Center, University of Rhode Island, Kingston, RI 02881.
John Birk , Hewlett-Packard Company, Palo Alto, CA 93303.
Rajarshi Ray , Object Recognition Systems, Inc., Princeton, NJ 08540.
pp. 631-645

Recognition of Agricultural Objects by Shape (Abstract)

A. Grossman , Agricultural Research Service, Western Regional Research Center, Berkeley, CA 94710.
T. F. Schatzki , Agricultural Research Service, Western Regional Research Center, Berkeley, CA 94710.
R. Young , Agricultural Research Service, Western Regional Research Center, Berkeley, CA 94710.
pp. 645-653

Viewer Independent Shape Recognition (Abstract)

Daniel Sabbah , Department of Computer Science, University of Rochester, Rochester, NY 14627.
Dana H. Ballard , Department of Computer Science, University of Rochester, Rochester, NY 14627.
pp. 653-660

On Closing the Fourier Descriptor Presentation (Abstract)

Nico J. D. Nagelkerke , Laboratory of Medical Physics, University of Amsterdam, Amsterdam, The Netherlands.
Jan Strackee , Laboratory of Medical Physics, University of Amsterdam, Amsterdam, The Netherlands.
pp. 660-661

On the Use of I-Divergence for Generating Distribution Approximations (Abstract)

M. A. G. Mattoso Maia , Electronics Laboratories, University of Kent at Canterbury, Kent CT2 7NT, England.
M. C. Fairhurst , Electronics Laboratories, University of Kent at Canterbury, Kent CT2 7NT, England.
pp. 661-664

Predicting the Required Number of Training Samples (Abstract)

D. A. Landgrebe , Engineering Experiment Station, Purdue University, West Lafayette, IN 47906.
H. M. Kalayeh , Object Recognition Systems, Inc., Princeton, NJ 08540.
pp. 664-667

Scale Preserving Smoothing of Polygons (Abstract)

B. J. Oommen , School of Computer Science, Carleton University, Ottawa, Ont., Canada K1S 5B6.
R. L. Kashyap , School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
pp. 667-671

Nonparametric Discriminant Analysis (Abstract)

K. Fukunaga , Department of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
J. M. Mantock , Department of Electrical Engineering, Purdue University, West Lafayette, IN 47907; Aerospace Corporation, Los Angeles, CA 90009; Texas Instruments, Inc., Lewisville, TX 75067.
pp. 671-678

The Asymptotic Optimal Frequency Domain Filter for Edge Detection (Abstract)

W. H. H. J. Lunscher , Departrment of Electrical Engineering, University of British Columbia, Vancouver, B.C., Canada V6T 1Z2.
pp. 678-680

Index Edics (PDF)

pp. 681-688

List of Contributors (PDF)

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[Front cover] (PDF)

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