Issue No. 05 - May (1981 vol. 3)
Charles J. Jacobus , Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801; Texas Instruments, Inc., Dallas, TX 75265.
Robert T. Chien , Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801.
This paper introduces two new edge detection algorithms. One uses multiple difference-based edge detectors. This scheme selects peak center by absolute maximum or center of mass techniques. The other algorithm is motivated by the observation that second-order enhancement improves human contour extraction, but generally confuses difference-based edge detectors. This algorithm translates intensity images into three state images (plus one, zero, and minus one), then uses multiple three-state edge masks to find edge positions. The second scheme has a multiple hardware implementation and interesting biological analogs. Finally, the two operators introduced are compared to some popular edge detection techniques from the literature.
R. T. Chien and C. J. Jacobus, "Two New Edge Detectors," in IEEE Transactions on Pattern Analysis & Machine Intelligence, vol. 3, no. , pp. 581-592, 1981.