The Community for Technology Leaders
Green Image
Issue No. 05 - May (1981 vol. 3)
ISSN: 0162-8828
pp: 581-592
Robert T. Chien , Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801.
Charles J. Jacobus , Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801; Texas Instruments, Inc., Dallas, TX 75265.
ABSTRACT
This paper introduces two new edge detection algorithms. One uses multiple difference-based edge detectors. This scheme selects peak center by absolute maximum or center of mass techniques. The other algorithm is motivated by the observation that second-order enhancement improves human contour extraction, but generally confuses difference-based edge detectors. This algorithm translates intensity images into three state images (plus one, zero, and minus one), then uses multiple three-state edge masks to find edge positions. The second scheme has a multiple hardware implementation and interesting biological analogs. Finally, the two operators introduced are compared to some popular edge detection techniques from the literature.
INDEX TERMS
CITATION
Robert T. Chien, Charles J. Jacobus, "Two New Edge Detectors", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol. 3, no. , pp. 581-592, May 1981, doi:10.1109/TPAMI.1981.4767149
106 ms
(Ver 3.1 (10032016))