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TABLE OF CONTENTS
Issue No. 03 - March (vol. 3)
ISSN: 0162-8828
Papers

[Front cover] (PDF)

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Breaker Page (PDF)

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Algorithms for Detecting M-Dimensional Objects in N-Dimensional Spaces (Abstract)

Larry H. Thiel , Department of Computer Science, Concordia University, Montreal, P.Q., Canada.
Vangalur S. Alagar , Department of Computer Science, Concordia University, Montreal, P.Q., Canada.
pp. 245-256

A Pyramidal Representation of Images and Its Feature Extraction Facility (Abstract)

Tadao Ichikawa , MEMBER, IEEE, Department of Engineering, Hiroshima University, Hiroshima, Japan.
pp. 257-264

Hierarchical Constraint Processes for Shape Analysis (Abstract)

Thomas C. Henderson , Institute of Communication Theory, German Aerospace Research Establishment, Oberpfaffenhofen, West Germany.
Larry S. Davis , MEMBER, IEEE, Department of Computer Sciences, University of Texas, Austin, TX 78712.
pp. 265-277

A Differential Operator Technique for Restoring Degraded Signals and Images (Abstract)

David G. Falconer , MEMBER, IEEE, Artificial Intelligence Center, SRI International, Menlo Park, CA 94025; Remote Measurements Laboratory, SRI International, Menlo Park, CA 94025.
John S. Ostrem , MEMBER, IEEE, Bioengineering Research Center, SRI International, Menlo Park, CA 94025.
pp. 278-284

Derivatives of Tree Sets with Applications to Grammatical Inference (Abstract)

Barry Levine , Department of Computer and Information Science, University of Oregon, Eugene, OR 97403.
pp. 285-293

Bayesian and Decision Tree Approaches for Pattern Recognition Including Feature Measurement Costs (Abstract)

G. R. Dattatreya , School of Automation, Indian Institute of Science, Bangalore, India.
V. V. S. Sarma , School of Automation, Indian Institute of Science, Bangalore, India.
pp. 293-298

Image Approximation by Variable Knot Bicubic Splines (Abstract)

Dennis G. Mccaughey , MEMBER, IEEE, Department of Systems Engineering, University of Arizona, Tucson, AZ; The Analytic Sciences Corporation, McLean, VA 22102.
Harry C. Andrews , SENIOR MEMBER, IEEE, Image Processing Institute, Departments of Electrical Engineering and Computer Science, University of Southern California, Los Angeles, CA; Comtal Corporation,
pp. 299-310

Three-Dimensional Shape Analysis Using Local Shape Descriptors (Abstract)

Keinosuke Fukunaga , FELLOW, IEEE, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
Owen Robert Mitchell , MEMBER, IEEE, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
Timothy P. Wallace , MEMBER, IEEE, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907; Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA 02173.
pp. 310-323

A Three-Dimensional Edge Operator (Abstract)

Robert A. Hummel , Courant Institute, New York University, New York, NY 10003.
Steven W. Zucker , Computer Vision and Graphics Laboratory, Department of Electrical Engineering, McGill University, Montreal, P.Q., Canada.
pp. 324-331

Parallel Computation of Contour Properties (Abstract)

Angela Y. Wu , Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Azriel Rosenfeld , Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Tsvi Dubitzki , Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
pp. 331-337

Evaluation of Image Fidelity by Means of the Fidelogram and Level Mean-Square Error (Abstract)

Hiroshi Katsulai , Department of Radiology, Faculty of Medi-cine, Chiba University, Chiba, Japan.
Noboru Arimizu , Department of Radiology, Faculty of Medi-cine, Chiba University, Chiba, Japan.
pp. 337-347

Reliable Indexing Using Unreliable Recognition Devices (Abstract)

James K. Mullin , Department of Computer Science, University of Western Ontario, London, Ont., Canada.
pp. 347-350

List of Reviewers (PDF)

pp. 353-354

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pp. 355

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pp. 356

List of Contributors (PDF)

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[Front cover] (PDF)

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