CSDL Home IEEE Transactions on Pattern Analysis & Machine Intelligence 1980 vol.2 Issue No.02 - February
Issue No.02 - February (1980 vol.2)
Bruce Schachter , General Electric Company, Daytona Beach, FL 32015.
Many measures have been developed to quantify the structural properties of image texture. This correspondence explores their applicability to textures generated by several standard models.
Bruce Schachter, "Model-Based Texture Measures", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.2, no. 2, pp. 169-171, February 1980, doi:10.1109/TPAMI.1980.4766995