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Issue No. 02 - February (1980 vol. 2)
ISSN: 0162-8828
pp: 169-171
Bruce Schachter , General Electric Company, Daytona Beach, FL 32015.
ABSTRACT
Many measures have been developed to quantify the structural properties of image texture. This correspondence explores their applicability to textures generated by several standard models.
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CITATION
Bruce Schachter, "Model-Based Texture Measures", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol. 2, no. , pp. 169-171, February 1980, doi:10.1109/TPAMI.1980.4766995
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