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Issue No.09 - September (2011 vol.17)
pp: 1286-1294
Hong-Yun Kim , Dept. of Electr. & Comput. Sci. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Chang-Hyo Yu , Syst. LSI Div., Samsung Electron. Co. Ltd., Yongin, South Korea
Lee-Sup Kim , Dept. of Electr. & Comput. Sci. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
The Unified Early Z-Test (U-EZT) is proposed to examine the visibility of pixels during tile-based rasterization in a mobile 3D graphics processor. U-EZT combines the advantages of the Z-max and Z-min EZT algorithms: the Z-max algorithm is improved by the independently updatable z-max tiles and the use of mask bits; and the Z-min algorithm is improved by reusing the mask bits from the z-max test to update the z-min tiles after tile rasterizing. As a result, storage requirements are reduced to 3 bits per pixel, and simulations suggest that U-EZT requires 20 percent to 57 percent less memory bandwidth than previous EZT algorithms.
Classification algorithms, Memory management, System-on-a-chip, Rendering (computer graphics),z-test., Computer graphics, graphics processors, visible line/surface algorithms
Hong-Yun Kim, Chang-Hyo Yu, Lee-Sup Kim, "A Memory-Efficient Unified Early Z-Test", IEEE Transactions on Visualization & Computer Graphics, vol.17, no. 9, pp. 1286-1294, September 2011, doi:10.1109/TVCG.2010.228
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