Issue No. 12 - Dec. (2013 vol. 62)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TC.2012.141
Irith Pomeranz , Purdue University, West Lafayette
Existing low-power test generation procedures use a single number to represent the power dissipation in a circuit or subcircuit. As a result, the specific signal transitions they create may deviate substantially from those possible during functional operation (and those the circuit is designed for). Functional broadside tests create functional operation conditions during their two functional capture cycles. Therefore, the specific signal transitions that occur during their second, fast functional capture cycles can occur during functional operation. This paper defines and studies the patterns of signal transitions under the second, fast functional capture cycles of functional broadside tests. These patterns can be used for evaluating the deviations from functional power dissipation created by low-power test sets that consist of arbitrary (functional and nonfunctional) broadside tests. They can also be used for guiding the generation of low-power test sets. The paper presents experimental results for both applications.
Power dissipation, Circuit faults, Switches, Pattern matching, Integrated circuit modeling, Computational modeling,transition faults, Full-scan circuits, power dissipation, switching activity, test generation
Irith Pomeranz, "Signal-Transition Patterns of Functional Broadside Tests", IEEE Transactions on Computers, vol. 62, no. , pp. 2544-2549, Dec. 2013, doi:10.1109/TC.2012.141