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Issue No. 02 - Feb. (2013 vol. 62)
ISSN: 0018-9340
pp: 242-246
Kyle Balston , University of British Columbia, Vancouver
Mehdi Karimibiuki , University of British Columbia, Vancouver
Alan J. Hu , University of British Columbia, Vancouver
Andre Ivanov , University of British Columbia, Vancouver
Steven J.E. Wilton , University of British Columbia, Vancouver
Effective techniques for post-silicon validation are required to better evaluate functional correctness of increasingly complex multi and many-core SoCs. However, there is little data evaluating the coverage of post-silicon validation efforts on industrial-scale designs. In this paper, we address this knowledge gap by instrumenting a nontrivial SoC with on-chip coverage monitors to measure the coverage achieved by typical post-silicon validation tests, such as booting the operating system (OS). We compare coverage achieved pre and post-silicon, and also measure the area overhead required to monitor post-silicon coverage. Our results show that the typical test of booting the OS often achieves high coverage, well correlated to what is achieved by pre-silicon directed tests, but in some blocks the coverage can be low or markedly different between pre and post-silicon, highlighting the importance of post-silicon validation in general and post-silicon coverage measurement in particular.
multiprocessing systems, operating systems (computers), system-on-chip

K. Balston, M. Karimibiuki, A. J. Hu, A. Ivanov and S. J. Wilton, "Post-silicon code coverage for multiprocessor system-on-chip designs," in IEEE Transactions on Computers, vol. 62, no. 2, pp. 242-246, 2013.
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