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Issue No. 07 - July (2012 vol. 61)
ISSN: 0018-9340
pp: 928-938
Wei-Chih Liu , National Taiwan University, Taipei
James Chien-Mo Li , National Taiwan University, Taipei
Wei-Lin Tsai , National Taiwan University, Taipei
ABSTRACT
This paper proposes four logic-chain bridging fault models, which involve one net in the combinational logic and the other net in the scan chain. Test results of logic-chain bridging faults, unlike existing scan chain fault models, depend on the previous scan inputs as well as primary inputs. A bridging pair extraction algorithm is proposed to quickly extract bridging pairs from the layout. The paper proposed two sets of structural reduction techniques so that runtime is very short. Experimental results on ISCAS benchmark circuits show that, on the average, logic-chain bridging faults can be diagnosed within an accuracy of four bridging pairs. The techniques are still applicable when there are only 10 failing patterns due to limited ATE failure memory. This paper demonstrates the feasibility to diagnose logic-chain bridging faults by software.
INDEX TERMS
Design for testability, diagnosis, scan.
CITATION
Wei-Chih Liu, James Chien-Mo Li, Wei-Lin Tsai, "Structural Reduction Techniques for Logic-Chain Bridging Fault Diagnosis", IEEE Transactions on Computers, vol. 61, no. , pp. 928-938, July 2012, doi:10.1109/TC.2011.98
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