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Issue No. 06 - June (2012 vol. 61)
ISSN: 0018-9340
pp: 899-904
Irith Pomeranz , Purdue University, West Lafayette
ABSTRACT
Functional test sequences have several advantages over structural tests when they are applied at-speed. A large pool of functional test sequences may be available for a circuit due to the application of a simulation-based design verification process. This paper describes a versatile procedure that uses a pool of functional test sequences as a basis for forming a single compact functional test sequence that achieves the same or higher gate-level fault coverage than the given pool. The procedure extracts test subsequences from the test sequences in the pool and concatenates them to form a single test sequence. It also employs an enhanced static test compaction process aimed at improving the fault coverage in addition to reducing the test sequence length.
INDEX TERMS
Functional test sequences, stuck-at faults, synchronous sequential circuits, transition faults.
CITATION
Irith Pomeranz, "Concatenation of Functional Test Subsequences for Improved Fault Coverage and Reduced Test Length", IEEE Transactions on Computers, vol. 61, no. , pp. 899-904, June 2012, doi:10.1109/TC.2011.107
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