Issue No. 04 - April (2011 vol. 60)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TC.2010.124
Adam B. Kinsman , McMaster University, Ontario, Canada
Nicola Nicolici , McMaster University, Ontario, Canada
While a large body of work on output unknown (X) tolerance exists, to the best of the authors' knowledge, no study is provided in the literature which explores the trade-off between X density and compression of circuit stimuli without reducing fault coverage. To this end, we introduce an architectural and algorithmic framework through which we explore this trade-off, the findings of which we discuss in the experimental results section.
Test data compression, response X-masking.
N. Nicolici and A. B. Kinsman, "Trade-Offs in Test Data Compression and Deterministic X-Masking of Responses," in IEEE Transactions on Computers, vol. 60, no. , pp. 498-507, 2010.