The Community for Technology Leaders
Green Image
Issue No. 12 - December (2008 vol. 57)
ISSN: 0018-9340
pp: 1704-1713
Alfredo Benso , Politecnico di Torino, Dip. Automatica e Informatica, C.so Duca degli Abruzzi 24, Torino
Alberto Bosio , LIRMM, Montpellier
Stefano Di Carlo , Politecnico di Torino, Dip. Automatica e Informatica, C.so Duca degli Abruzzi 24, Torino
Giorgio Di Natale , LIRMM, Montpellier
Paolo Prinetto , Politecnico di Torino, Dip. Automatica e Informatica, C.so Duca degli Abruzzi 24, Torino
ABSTRACT
Memory testing commonly faces two issues: the characterization of detailed and realistic fault models, and the definition of time-efficient test algorithms to detect them. March tests have proven to be a fast, simple and regularly structured class of memory test algorithms. This paper proposes a new polynomial algorithm to automatically generate march tests. The formal model adopted to represent memory faults allows the definition of a general methodology to deal with both static, dynamic and linked faults.
INDEX TERMS
Reliability, Testing, and Fault-Tolerance, Test generation
CITATION

P. Prinetto, A. Bosio, A. Benso, S. Di Carlo and G. Di Natale, "March Test Generation Revealed," in IEEE Transactions on Computers, vol. 57, no. , pp. 1704-1713, 2008.
doi:10.1109/TC.2008.105
81 ms
(Ver 3.3 (11022016))