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Issue No. 12 - December (2008 vol. 57)
ISSN: 0018-9340
pp: 1704-1713
Paolo Prinetto , Politecnico di Torino, Dip. Automatica e Informatica, C.so Duca degli Abruzzi 24, Torino
Alberto Bosio , LIRMM, Montpellier
Alfredo Benso , Politecnico di Torino, Dip. Automatica e Informatica, C.so Duca degli Abruzzi 24, Torino
Stefano Di Carlo , Politecnico di Torino, Dip. Automatica e Informatica, C.so Duca degli Abruzzi 24, Torino
Giorgio Di Natale , LIRMM, Montpellier
ABSTRACT
Memory testing commonly faces two issues: the characterization of detailed and realistic fault models, and the definition of time-efficient test algorithms to detect them. March tests have proven to be a fast, simple and regularly structured class of memory test algorithms. This paper proposes a new polynomial algorithm to automatically generate march tests. The formal model adopted to represent memory faults allows the definition of a general methodology to deal with both static, dynamic and linked faults.
INDEX TERMS
Reliability, Testing, and Fault-Tolerance, Test generation
CITATION
Paolo Prinetto, Alberto Bosio, Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, "March Test Generation Revealed", IEEE Transactions on Computers, vol. 57, no. , pp. 1704-1713, December 2008, doi:10.1109/TC.2008.105
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