A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip
Issue No. 09 - September (2008 vol. 57)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TC.2008.62
A novel strategy to detect interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control and communication handshake lines are considered in a cost-effective test sequence for Mesh NoC topologies based on XY routing.
and Fault-Tolerance, Interconnections (Subsystems), Reliability, Testing
"A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip", IEEE Transactions on Computers, vol. 57, no. , pp. 1, September 2008, doi:10.1109/TC.2008.62