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This paper presents a new compression technique for testing the intellectual property (IP) cores in system-on-chips. The pattern run-length compression applies the well-known run-length coding to equal and complementary consecutive patterns of the precomputed test data. No structural information of the IP cores is required by the encoding procedure. A data-independent decompressor can be realized by the embedded processor or on-chip circuitry. The decompressed test set can be flexibly applied to a single-scan or multiple-scan chain of each core-under-test. Experiments on ISCAS-89 benchmarks show that the new technique results in superior compression performance. The test application time is also significantly reduced.
Automatic test equipment, automatic test pattern generator, embedded core testing, run-length coding, system-on-chips, test data compression.

X. Ruan and R. S. Katti, "Data-Independent Pattern Run-Length Compression for Testing Embedded Cores in SoCs," in IEEE Transactions on Computers, vol. 56, no. , pp. 545-556, 2007.
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