Issue No. 12 - December (2006 vol. 55)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TC.2006.203
Said Hamdioui , IEEE
Zaid Al-Ars , IEEE
Ad J. van de Goor , IEEE
This paper presents a complete electrical analysis of Address decoder Delay Faults "ADFs” caused by resistive opens in RAMs. A classification between inter and intragate opens is made. A systematic way is introduced to explore the space of possible tests to detect these faults; it is based on generating appropriate sensitizing address transitions and the corresponding sensitizing operation sequences. DFT features are given to facilitate the BIST implementation of the new tests.
Memory testing, open defects, address decoder delay faults, addressing methods, BIST, DFT.
A. J. van de Goor, Z. Al-Ars and S. Hamdioui, "Opens and Delay Faults in CMOS RAM Address Decoders," in IEEE Transactions on Computers, vol. 55, no. , pp. 1630-1639, 2006.