The Construction of Optimal Deterministic Partitionings in Scan-Based BIST Fault Diagnosis: Mathematical Foundations and Cost-Effective Implementations
Issue No. 01 - January (2005 vol. 54)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TC.2005.14
Alex Orailoglu , IEEE
Partitioning techniques enable identification of fault-embedding scan cells in scan-based BIST. We introduce, in this paper, deterministic partitioning techniques capable of resolving the location of the fault-embedding scan cells. We outline a complete mathematical analysis that identifies the class of deterministic partitioning structures and complement this rigorous mathematical analysis with an exposition of the appropriate cost-effective implementation techniques. We validate the superiority of the deterministic techniques both in an average-case sense by conducting simulation experiments and in a worst-case sense through a thorough mathematical analysis.
Fault diagnosis, scan-based BIST, finite field arithmetic.
A. Orailoglu and I. Bayraktaroglu, "The Construction of Optimal Deterministic Partitionings in Scan-Based BIST Fault Diagnosis: Mathematical Foundations and Cost-Effective Implementations," in IEEE Transactions on Computers, vol. 54, no. , pp. 61-75, 2005.