ABSTRACT

<p><b>Abstract</b>—A (<tmath>k,K</tmath>) circuit is one which can be decomposed into nonintersecting blocks of gates where each block has no more than <tmath>K</tmath> external inputs, such that the graph formed by letting each block be a node and inserting edges between blocks if they share a signal line, is a partial k-tree. (<tmath>k,K</tmath>) circuits are special in that they have been shown to be testable in time polynomial in the number of gates in the circuit, and are useful if the constants <tmath>k</tmath> and <tmath>K</tmath> are small. We demonstrate a procedure to synthesise (<tmath>k,K</tmath>) circuits from a special class of Boolean expressions.</p>

INDEX TERMS

Testing, stuck-at fault, polynomial time, k-tree, treewidth, synthesis.

CITATION

V. Chandru and S. R. Naidu, "On Synthesis of Easily Testable (k, K) Circuits," in

*IEEE Transactions on Computers*, vol. 52, no. , pp. 1490-1494, 2003.

doi:10.1109/TC.2003.1244946

CITATIONS