Issue No. 07 - July (2001 vol. 50)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.936234
<p><b>Abstract</b>—This paper presents a new pseudoexhaustive test methodology for digital finite impulse response (FIR) filters. The proposed scheme can be employed to detect any combinational faults within the basic cell of the functional units occurring in linear phase comb filters, trees of sign-extended adders and phase-shift multipliers. It uses additive generators as a source of pseudo-exhaustive patterns to systematically test all FIR filter building blocks.</p>
Complex multipliers, design for testability, FIR filters, pseudoexhaustive testing, sign-extended adders, cell fault model, state coverage, trees of adders.
J. Rajski, J. Tyszer and N. Mukherjee, "Testing Schemes for FIR Filter Structures," in IEEE Transactions on Computers, vol. 50, no. , pp. 674-688, 2001.