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ABSTRACT
<p><b>Abstract</b>—In 1972, Reddy showed that the binary circuits realizing Reed-Muller canonical form are easily testable. In this paper, we extend Reddy's result to multiple-valued logic circuits, employing more than two discrete levels of signal. The electronic fabrication of such circuits became feasible due to the recent advances in integrated circuit technology. We show that, in the multiple-valued case, several new phenomena occur which allow us to asymptotically reduce the upper bound on the number of tests required for fault detection, but make the generation of tests harder.</p>
INDEX TERMS
Multiple-valued function, Reed-Muller circuit, easily testable circuit, stuck-at fault.
CITATION
J.c. Muzio, E.v. Dubrova, "Easily Testable Multiple-Valued Logic Circuits Derived from Reed-Muller Circuits", IEEE Transactions on Computers, vol. 49, no. , pp. 1285-1289, November 2000, doi:10.1109/12.895943
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